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来源: 《安全与电磁兼容》2020年 作者:Xingchang Wei, Li Ding

Near-field EMC Measurement Technology


With the advancement of the electromagnetic probe and electromagnetic algorithm, the near-field scanning is expected to form a near-field and far-field integrated electromagnetic compatibility (EMC) test system, together with EMC anechoic chamber and microwave reverberation chamber. This paper summaries recent development of the near-field EMC testing technology. It mainly includes the reconstruction of equivalent radiation source by scanning electromagnetic field, evaluation of shielding effectiveness of weak radiator based on scanning field, and the design of the multi-components electromagnetic probe.

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