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来源：
《安全与电磁兼容》2019年
作者：Hu Yusheng
Numerical Simulation for the Effect of Embedded High Dielectric Constant Material on Signal Integrity of Via Transition
本期目录
- Latest Technolo...
- Measuring Elect...
- EMC Challenges ...
- Key EMC Technol...
- Intentional Rad...
- Marriage of Ele...
- De-risking Reso...
- HEMP Filter Des...
- Discussion on U...
- DGS-based High ...
- Frequency Selec...
- Numerical Simul...
- 5G Millimeter W...
- EMC Measuring C...
- Radiation Suppr...
- Voluntary Contr...
